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Arbitrary Modeling of TSVs for 3D Integrated Circuits formatIsbn:Hardcover - 9783319076102 Essay from the year 2013

SKU 68996661630
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Description

Essay from the year 2013 in the subject History - Asia

1Überblick7

Grafikkarte und Softwareschulung

Diese Abgrenzung ist deshalb so wichtig

die durch ihre Interventionen auf struktureller wie personaler Ebene das Miteinander

Arbitrary Modeling of TSVs for 3D Integrated Circuits formatIsbn:Hardcover - 9783319076102 Essay from the year 2013This book presents a wide band and technology independent, SPICE compatible RLC model for through silicon vias (TSVs) in 3D integrated circuits. This model accounts for a variety of effects, including skin effect, depletion capacitance and nearby contact effects. Readers will benefit from in depth coverage of concepts and technology such as 3D integration, Macro modeling, dimensional analysis and compact modeling, as well as closed form equations for

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